Published February 4, 2002
| Version v1
Journal article
Development of half-metallic ultrathin Fe3O4 films for spin-transport devices
Creators
- 1. Nagoya University, Department of Crystalline Materials Science, Furo-cho, Chikusa-ku, Nagoya 464-8603 (Japan)
- 2. Central Research Laboratory, Hitachi Limited, Information Storage Research Department, 1-280, Higashi-Koigakubo, Kokubunji, Tokyo 185-8601 (Japan)
Description
We attempted to fabricate a high-quality Fe3O4 film while satisfying both low-thermal preparation (IE573 K) and film thinness (IE500 Aa). X-ray diffractometry showed that our prepared Fe3O4 film was epitaxially grown onto a MgO (100) substrate. The saturation magnetization, resistivity, and Verwey point were, respectively, ∼438 emu/cm3, ∼10 000 μ Ω cm, and ∼110 K. These values were comparable to those of the Fe3O4 bulk. Our experimental results suggested that a high-quality Fe3O4 film could be obtained even under the crucial conditions of the deposition temperature being low (∼523 K) and the film being ultrathinned (∼100 Aa)
Additional details
Identifiers
- DOI
- 10.1063/1.1446995;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 80
- Journal Issue
- 5
- Journal Page Range
- p. 823-825
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35011212
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- FERROMAGNETIC MATERIALS; IRON OXIDES; MAGNETIC PROPERTIES; MAGNETIZATION; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; FILMS; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2002 American Institute of Physics.