Published September 1990 | Version v1
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Study of the effect of reactive element addition by implanting metal ions in a pre-formed oxide layer

  • 1. Lawrence Berkeley Lab., CA (USA)
  • 2. Electric Power Research Inst., Palo Alto, CA (USA)

Description

The influence of ion-implanted Y, Hf, Zr and Cr on the oxidation behavior of a Ni-25 wt % CR alloy at 1000 degrees C has been investigated. The implantation dosage was 5 x 1016 ions/cm2. Two methods of implantation have been used. One was to implant ions directly into a clean alloy surface; the other was to implant into an approximately 0.6 μm thick Cr2O3 layer formed at 1000 degrees C on the alloy. In neither case did the Cr implantation show any beneficial effects. Implantations of Y, Hf and Zr produced all the reactive element effects, i.e. reduction in oxidation rate, elimination of base metal oxide formation and improvement in scale adhesion, only if the ions were initially implanted in the alloy. When the ions were implanted in a preformed oxide, the subsequent oxidation process was altered to the same degree as before, but the scale adhesion was not affected. Implications of these results to the mechanism of the reactive element effect are discussed. 10 refs., 4 figs

Availability note (English)

MF available from INIS under the Report Number; OSTI as DE91011916; NTIS; INIS.

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Additional details

Publishing Information

Imprint Pagination
16 p.
Report number
LBL--29522

Conference

Title
7. international conference on ion beam modification of materials.
Dates
9-14 Sep 1990.
Place
Knoxville, TN (USA).

Optional Information

Contract/Grant/Project number
Contract AC03-76SF00098
Funding organization
Electric Power Research Inst., Palo Alto, CA (USA).
Secondary number(s)
CONF-900936--28.