How the macroscopic current correlates with the microscopic flux-line distribution in a type-II superconductor: an experimental study
- 1. Atominstitut, Vienna University of Technology, 1020 Vienna (Austria)
Description
We present a study of the real-space flux-line lattice (FLL) of pristine and neutron irradiated conventional type-II superconductors using scanning tunnelling microscopy. Our work is focused on the magnetic field range, where the critical current density shows a second peak as a result of neutron irradiation. Scanning tunnelling microscopy images, including more than 2000 flux lines, are used to evaluate various microscopic parameters describing the disorder of the FLL, such as the defect density, the nearest neighbour distances and correlation functions. These parameters are compared with the macroscopic critical current density of the samples. The results show a direct correlation of the micro- and macroscopic properties. We observe a clear transition from an ordered to a disordered lattice at the onset of the second peak. Moreover, we discuss the defects of the FLL and their accumulation to large clusters in the second peak region. (papers)
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-2048/27/7/075004Additional details
Identifiers
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 27
- Journal Issue
- 7
- Journal Page Range
- [8 p.]
- ISSN
- 0953-2048
- CODEN
- SUSTEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47036559
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BUILDUP; COMPARATIVE EVALUATIONS; CORRELATION FUNCTIONS; CORRELATIONS; CRITICAL CURRENT; CRYSTAL DEFECTS; CRYSTAL LATTICES; IRRADIATION; MAGNETIC FIELDS; MAGNETIC FLUX; NEUTRON FLUENCE; PHYSICAL RADIATION EFFECTS; SCANNING TUNNELING MICROSCOPY; TYPE-II SUPERCONDUCTORS
- Descriptors DEC
- CRYSTAL STRUCTURE; CURRENTS; ELECTRIC CURRENTS; EVALUATION; FUNCTIONS; MICROSCOPY; RADIATION EFFECTS; SUPERCONDUCTORS