Published January 11, 2007 | Version v1
Journal article

Influence of temperature on the response of high-quality polycrystalline diamond detectors

  • 1. Department of Physics, Via Sansone 1, I-50019 Sesto Fiorentino, Florence (Italy)
  • 2. National Institute for Nuclear Physics, INFN, Via Sansone 1, I-50019 Sesto Fiorentino, Florence (Italy)
  • 3. National Institute for Nuclear Physics and High Energy Physics, NIKHEF, Kruislaan 409, 1098 SJ Amsterdam (Netherlands)
  • 4. Department of Energetics, Via Santa Marta 3, I-50139 Florence (Italy)
  • 5. National Institute for Nuclear Physics, INFN, Via Sansone 1, I-50019 Sesto Fiorentino, Florence (Italy) and Department of Energetics, Via Santa Marta 3, I-50139 Florence (Italy)

Description

We investigated the charge collection properties of a polycrystalline CVD diamond detector in a temperature range from -10 to 80 deg. C, by means of a 90Sr minimum ionizing β radiation source. The sample is a state-of-the-art diamond sensor yielding a maximum charge collection distance of 260μm at room temperature and 1V/μm applied field, when set in the so called pumped state, i.e., after passivating the deep traps with a pre-irradiation with β particles. We observed a decreasing charge collection distance with increasing temperature, which is a trend opposite to that reported recently by other research groups. We ascribe this discrepancy to the higher quality of our detector, in terms of a lower concentration of defects and grain boundaries. Conversely, we observe a less dramatic temperature dependence which we tentatively explain assuming a combined effect of variation with temperature of the thermal velocity and of the capture cross-section, according to a well known model of multi-phonon non-radiative processes

Additional details

Identifiers

DOI
10.1016/j.nima.2006.09.030;
PII
S0168-9002(06)01649-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
570
Journal Issue
2
Journal Page Range
p. 303-307
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
7. international conference on large scale applications and radiation hardness of semiconductor detectors
Dates
5-7 Oct 2006
Place
Florence (Italy)

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.