Growth and magnetic study of sputtered Fe/Al multilayers
- 1. LPMTM (CNRS-UPR 9001), Universite Paris 13, 99 Av. J.B. Clement, 93430 Villetaneuse (France)
- 2. LPMTM (CNRS-UPR 9001), Universite Paris 13, 99 Av. J.B. Clement, 93430 Villetaneuse (France) and Department of Physics, College of Science, Sultan Qaboos University, P.O. Box 36, Al-Khodh 123 (Oman)
- 3. Department of Physics, College of Science, Sultan Qaboos University, P.O. Box 36, Al-Khodh 123 (Oman)
Description
Brillouin light scattering (BLS) and vibrating sample magnetometry (VSM) were used to study the effect of interfacial intermixing and microstructure on the magnetic properties of DC magnetron sputtered Fe/Al multilayers (MLs) on Si(1 0 0) substrate. Three samples with nominal composition [Al (4 nm)/Fe (3.7 nm)]x18 and deposited under different negative DC bias voltages (V b = -50, -200 and -400 V) have been investigated. The X-ray diffraction results indicate that the FeAl MLs have a poor crystallinity with no evidence of the absence of B2 phase. The grazing X-ray reflectivity results suggest that the interfacial roughness and intermixing were gradually reduced from 0.7 to 0.5 nm (±0.05 nm) by increasing V b from -50 to -400 V. The magnetization measurements demonstrate the presence of in-plane uniaxial anisotropy and magnetically dead interfacial layers. The BLS results reveal spin-wave surface modes whose frequencies also depend on the applied Vb. The same trend upon V b was observed for the perpendicular and in-plane anisotropies
Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2006.12.009;
- PII
- S0921-5107(06)00693-3;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 138
- Journal Issue
- 1
- Journal Page Range
- p. 16-21
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38087240
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; ANISOTROPY; ELECTRIC POTENTIAL; GRAZING; IRON; LAYERS; LIGHT SCATTERING; MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETRONS; MICROSTRUCTURE; REFLECTIVITY; ROUGHNESS; SPIN WAVES; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FEEDING; MAGNETOMETERS; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SURFACE PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.