Published January 31, 2012
| Version v1
Journal article
Pulsed-laser deposition of heteroepitaxial corundum-type ZITO: cor-In2−2xZnxSnxO3
- 1. Department of Chemistry, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208 (United States)
- 2. Department of Materials Science and Engineering, 2220 Campus Drive, Evanston, IL 60208 (United States)
Description
Thin films of corundum-type In2−2xZnxSnxO3 (cor-ZITO) were grown on lattice-matched substrates using pulsed laser deposition. The (001) of the corundum-type film grew heteroepitaxial to the (001) of a LiNbO3 substrate with large grains along the in-plane and out-of-plane orientation characterized by glancing incidence X-ray diffraction and four-circle Φ-scans. A film with 34% In (metals basis) exhibited a wide optical gap of 3.9 eV and a modest conductivity of 134 S/cm, which suggests cor-ZITO is a potential low-cost transparent conducting oxide.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.10.012Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.10.012;
- PII
- S0040-6090(11)01751-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 520
- Journal Issue
- 7
- Journal Page Range
- p. 2938-2942
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43108774
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CORUNDUM; ENERGY BEAM DEPOSITION; EPITAXY; INDIUM; LASER RADIATION; NIOBATES; NIOBIUM OXIDES; PULSED IRRADIATION; SUBSTRATES; THIN FILMS; TIN OXIDES; X-RAY DIFFRACTION; ZINC
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IRRADIATION; METALS; MINERALS; NIOBIUM COMPOUNDS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; REFRACTORY METAL COMPOUNDS; SCATTERING; SURFACE COATING; TIN COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.