Published March 2006 | Version v1
Journal article

Effect of magnetic-field configuration on the beam intensity from electron cyclotron resonance ion source and RIKEN superconducting electron cyclotron resonance ion source

  • 1. RIKEN, Hirosawa 2-1, Wako, Saitama 351-0198 (Japan)
  • 2. SAS Ltd., Kita-shinagawa 5-9-11, Shinjuku-ku, Tokyo (Japan)

Description

We measured the main plasma parameters (density of electron, temperature of electrons, and ion confinement time) as a function of Bmin and Binj with laser ablation technique. We observed that the Bmin mainly affects the temperature and density of electrons and all of the three parameters increase with increasing the Binj. We also observed that the gas pressure of the plasma chamber at the rf injection side became minimum at the optimum value for Bmin at fixed gas flow. This result indicates that the ionization efficiency becomes maximum at optimum value for Bmin. From these results, it is concluded that the plasma production is strongly dependent on the Bmin (plasma generator). We also observed that the Binj affects the ion confinement time, temperature, and density of electrons. All of the three parameters increase with increasing Binj

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
77
Journal Issue
3
Journal Page Range
p. 03A304-03A3044
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
11. international conference on ion sources
Dates
12-16 Sep 2005
Place
Caen (France)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37083240
Subject category
S43: PARTICLE ACCELERATORS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABLATION; BEAMS; CONFINEMENT TIME; ECR ION SOURCES; ELECTRON TEMPERATURE; ELECTRONS; GAS FLOW; ION TEMPERATURE; IONS; MAGNETIC FIELD CONFIGURATIONS; PLASMA; PLASMA DENSITY; PLASMA DIAGNOSTICS; PLASMA PRODUCTION
Descriptors DEC
CHARGED PARTICLES; ELEMENTARY PARTICLES; FERMIONS; FLUID FLOW; ION SOURCES; LEPTONS

Optional Information

Notes
(c) 2006 American Institute of Physics