Published March 31, 2003 | Version v1
Journal article

Simulation of section curve by phase constant dynamic mode atomic force microscopy in non-contact situation

Description

We investigate the behavior of an oscillating tip operating in tapping mode, e.g. with fixed drive frequency and drive excitation while scanning horizontally an ideal flat surface holding a small corrugation. The numerical simulations are performed to compare the relative vertical and lateral sensitivity of the oscillator when the feedback loop controlling the tip-sample distance keeps constant the oscillator phase instead of the amplitude. In these simulations, a sphere lies on a flat surface and a Van der Waals force is assumed between the tip, the sphere and the substrate. Once the tip has approached from the substrate far from the sphere, the tip is scanned towards the sphere. It is found that the phase constant mode makes smaller indentation and better response height probably without larger damage by using wider setpoint value (SPV) than the cases of amplitude constant mode

Additional details

Identifiers

DOI
10.1016/S0169-4332(02)01478-2;
arXiv
arXiv:hep-th/0107037v1;
PII
S0169433202014782;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
210
Journal Issue
1-2
Journal Page Range
p. 49-53
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
5. international conference on noncontact atomic force microscopy (AFM)
Acronym
NC-AFM 2002
Dates
11-14 Aug 2002
Place
Montreal (Canada)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38086478
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; EXCITATION; OSCILLATORS; SENSITIVITY; SIMULATION; SUBSTRATES; SURFACES; VAN DER WAALS FORCES
Descriptors DEC
ELECTRONIC EQUIPMENT; ENERGY-LEVEL TRANSITIONS; EQUIPMENT; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.