Simulation of section curve by phase constant dynamic mode atomic force microscopy in non-contact situation
Creators
Description
We investigate the behavior of an oscillating tip operating in tapping mode, e.g. with fixed drive frequency and drive excitation while scanning horizontally an ideal flat surface holding a small corrugation. The numerical simulations are performed to compare the relative vertical and lateral sensitivity of the oscillator when the feedback loop controlling the tip-sample distance keeps constant the oscillator phase instead of the amplitude. In these simulations, a sphere lies on a flat surface and a Van der Waals force is assumed between the tip, the sphere and the substrate. Once the tip has approached from the substrate far from the sphere, the tip is scanned towards the sphere. It is found that the phase constant mode makes smaller indentation and better response height probably without larger damage by using wider setpoint value (SPV) than the cases of amplitude constant mode
Additional details
Identifiers
- DOI
- 10.1016/S0169-4332(02)01478-2;
- arXiv
- arXiv:hep-th/0107037v1;
- PII
- S0169433202014782;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 210
- Journal Issue
- 1-2
- Journal Page Range
- p. 49-53
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 5. international conference on noncontact atomic force microscopy (AFM)
- Acronym
- NC-AFM 2002
- Dates
- 11-14 Aug 2002
- Place
- Montreal (Canada)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38086478
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; EXCITATION; OSCILLATORS; SENSITIVITY; SIMULATION; SUBSTRATES; SURFACES; VAN DER WAALS FORCES
- Descriptors DEC
- ELECTRONIC EQUIPMENT; ENERGY-LEVEL TRANSITIONS; EQUIPMENT; MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.