Patterns of Variation in the External Quantum Efficiency of InGaN/GaN Green LEDs during Accelerated Tests

The causes and mechanisms of variation in the quantum efficiency and other characteristics of InGaN/GaN heterostructures are actively investigated in various operating modes. The results are presented from an experimental study of the variation in the external quantum efficiency of low-power InGaN/GaN green light-emitting diodes with and without a quantum well in the space–charge region (SCR) of the heterostructure in the accelerated test mode. It is found that after 8 hours of testing at a temperature of 300 K in the pulse mode with a pulse amplitude of 0.5 A, a pulse duration of 100 µs, and a duty cycle of 100, the external quantum efficiency grows for all LEDs without a quantum well in the SCR and diminishes for LEDs with a quantum well throughout the range of operating currents. It is shown that at a low level of injection, the intensity of emission of light emitting diodes without a quantum well in the SCR is determined by recombination processes according to the Shockley–Read–Hall mechanism, while that of LEDs with a quantum well is determined by tunneling–recombination processes. Current training of green LEDs based on InGaN/GaN heterostructures in the forced pulse mode for 4 hours can be used as a technological operation for stabilizing their lighting characteristics, and for identifying potentially unreliable products under conditions of mass production.