Published April 1992
| Version v1
Journal article
Evaluation of AC-coupled silicon microstrip detectors and Berkeley SVXD readout with 227 GeV/c pions
Creators
- 1. Oklahoma Univ., Norman, OK (United States)
- 2. Yale Univ., New Haven, CT (United States)
- 3. Iowa Univ., Iowa City, IA (United States)
Description
This paper reports on single sided and double sided AC coupled silicon microstrip detectors read out with Berkeley SVX version D VSLI chips tested in a 227 GeV/c charged pion beam at Fermilab. Pulse height information, cluster size and spatial resolution have been studied as a function of incident beam angle. It was found that the experimental spatial resolution agrees with Monte Carlo predictions and that the average pulse height and cluster size increase accordingly with increasing angle of particle incidence from the normal
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 38
- Journal Issue
- 2
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 446-453
- ISSN
- 0018-9499
- CODEN
- IETNA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23012269
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- AC SYSTEMS; EXPERIMENTAL DATA; FERMILAB ACCELERATOR; INCIDENCE ANGLE; MONTE CARLO METHOD; PERFORMANCE TESTING; PION BEAMS; RADIATION DETECTORS; SILICON; SPATIAL RESOLUTION
- Descriptors DEC
- ACCELERATORS; BEAMS; CYCLIC ACCELERATORS; DATA; ELEMENTS; INFORMATION; MEASURING INSTRUMENTS; MESON BEAMS; NUMERICAL DATA; PARTICLE BEAMS; POWER SYSTEMS; RESOLUTION; SEMIMETALS; SYNCHROTRONS; TESTING