Published June 1988 | Version v1
Journal article

An improved method for using Doppler-broadened positron annihilation spectroscopy for the study of the electronic properties of materials

  • 1. Georgia Inst. of Tech., Atlanta (USA). School of Materials Engineering

Description

The microspectrum data collection method is shown to improve the reproducibility of the Doppler PAS technique by reducing non-statistical counting errors. The raw data are then deconvoluted to remove the effects of instrumental broadening. This procedure is used to calculate the Fermi energy level in high-purity polycrystals of Cu and Al. Using a best-fit parabola superimposed on a gaussian we find Esub(f)(Cu) = 7.8 eV and Esub(f)(Al) = 12.4 eV. These values are compared with both theoretical values and corresponding values calculated from the angular correlation PAS technique. (author)

Additional details

Publishing Information

Journal Title
J. Phys., E
Journal Volume
21
Journal Issue
6
Series
J. Phys., E.
Journal Page Range
595-600
ISSN
0022-3735
CODEN
JPSIA