Published February 15, 2013
| Version v1
Journal article
Electronic structures in unoccupied states of Bi thin film studied with two-photon photoemission spectroscopy
Creators
- 1. Synchrotron Light Application Center, Saga University, 1 Honjo, Saga 840-8502 (Japan)
- 2. Department of Mechanical Engineering, Kobe University, Nada-ku, Kobe 657-8501 (Japan)
Description
We have performed synchrotron-radiation angle-resolved photoemission and angle-resolved two-photon photoemission (2PPE) study of Bi(1 1 1) films with the thickness of 12 bilayers grown on Si(1 1 1) – 7 × 7. From the detailed analysis of the excitation energy dependence of angle-resolved 2PPE spectra, we have determined the electronic structures in the occupied and unoccupied regions. The observed electronic structures in the unoccupied states above the Fermi-energy were attributed to the quantum-well states originate from the quantization of the 6p-derived bulk bands.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2012.07.002Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2012.07.002;
- PII
- S0169-4332(12)01176-2;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 267
- Journal Page Range
- p. 66-69
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 11. international conference on atomically controlled surfaces, interfaces and nanostructures
- Dates
- 3-7 Oct 2011
- Place
- St. Petersburg (Russian Federation)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46002801
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BISMUTH; DISPERSIONS; ELECTRONIC STRUCTURE; ENERGY DEPENDENCE; EXCITATION; PHOTOEMISSION; PHOTONS; QUANTIZATION; QUANTUM WELLS; SPECTRA; SPECTROSCOPY; SYNCHROTRON RADIATION; THICKNESS; THIN FILMS
- Descriptors DEC
- BOSONS; BREMSSTRAHLUNG; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; ENERGY-LEVEL TRANSITIONS; FILMS; MASSLESS PARTICLES; METALS; NANOSTRUCTURES; RADIATIONS; SECONDARY EMISSION
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.