Semi-transparent X-UV multilayer: theoretical analysis, characterisation and applications
Description
This work presents a study of semi-transparent X-UV multilayers. These were fabricated by local destruction of a substrate or by multilayer deposition on a low absorbance thin film. From these multilayers an X-Ray beamsplitter can be made which has a good transmission coefficient and a large relection coefficient. The compromise between transmittance and reflectance can be optimized by choosing adequate parameters for both the multilayer and the substrate. This can be done using calculation methods developed for X-UV interferential mirrors. An experimental apparatus called multilayers bichromator was then developed. It is based on the semi-transparent multilayer properties. This made possible the study of the time shift between two neon plasma emission lines in the one KeV range
Availability note (English)
MF available from INIS under the Report Number.Abstract (French)
Ce travail concerne l'etude de multicouches semi-transparentes dans les domaines X et X-UV: ces systemes sont obtenus par destruction locale du substrat ou par depot d'une multicouche sur un film mince peu absorbant. Ils constituent des separateurs de faisceaux X qui associent un bon coefficient de transmission et un bon pouvoir de reflexion. L'utilisation des methodes de calcul adaptees aux miroirs interferentiels, en particulier le formalisme matriciel, permet d'optimiser le couple transmittance-reflectance par un choix ad hoc des parametres de la multicouche et de son support. Un dispositif experimental, appele bichromateur a multicouche, utilisant les proprietes d'une multicouche semi-transparente, a permis d'etudier la chronometrie d'apparition de deux raies d'emission d'un plasma de neon dans la region du KeV. D'autres applications sont envisageesFiles
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Additional details
Additional titles
- Original title (French)
- Miroirs multicouches interferentiels semi-transparents pour les rayonnements X et X-UV: modelisation, caracterisation et applications
Publishing Information
- Imprint Pagination
- 276 p.
- Report number
- CEA-R--5536
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 22032189
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- BEAM SPLITTING; LAYERS; MIRRORS; REFLECTION; TRANSMISSION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- DIFFRACTOMETERS; MEASURING INSTRUMENTS