Published June 2024
| Version v1
Journal article
Charge disproportionation for trimerization and tetramerization in spinel-type AlV2O4
Creators
- 1. Waseda University, Department of Applied Physics, Tokyo (Japan)
- 2. Tokyo University of Science, Department of Applied Physics, Tokyo (Japan)
- 3. Japan Synchrotron Radiation Research Institute (JASRI/SPring-8), Sayo, Hyogo (Japan)
- 4. Nagoya University, Institute of Materials and Systems for Sustainability (IMaSS), Nagoya, Aichi (Japan)
- 5. Waseda University, Department of Physics, Tokyo (Japan)
Description
The electronic structure of spinel-type AlV2O4 is investigated using bulk-sensitive hard x-ray photoemission spectroscopy (HAXPES). The main and shoulder peaks of the V 2p3/2 core-level HAXPES spectra indicate charge disproportionation between V2+ and V3+, consistent with the average V valence of +2.5. The estimated V2+/V3+ ratio is compatible with the formation of V trimers and tetramers in AlV2O4, providing a hint to develop a model for charge and orbital orderings in the V pyrochlore lattice. We propose that V2+ tetramers and V3+ trimers on the pyrochlore lattice are naturally explained by an orbitally induced Peierls mechanism. (author)
Availability note (English)
Available from DOI: https://doi.org/10.7566/JPSJ.93.074709Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of the Physical Society of Japan (Online)
- Journal Volume
- 93
- Journal Issue
- 7
- Journal Page Range
- p. 074709.1-074709.6
- ISSN
- 1347-4073
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 56002799
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BINDING ENERGY; CHARGE TRANSPORT; DENSITY FUNCTIONAL METHOD; ELECTRICAL INSULATORS; ELECTRONIC STRUCTURE; FERMI LEVEL; PHASE TRANSFORMATIONS; PHOTOIONIZATION; VANADIUM IONS; VANADIUM OXIDES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CALCULATION METHODS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL EQUIPMENT; ELECTRON SPECTROSCOPY; ENERGY; ENERGY LEVELS; EQUIPMENT; IONIZATION; IONS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS; VARIATIONAL METHODS
Optional Information
- Notes
- 40 refs., 6 figs.