Progress in microtomography with the Bragg Magnifier at SLS
- 1. Swiss Light Source, Paul Scherrer Institut, CH-5232, Villigen (Switzerland)
- 2. FRMII, Technische Universitaet Muenchen, D-85747, Garching (Germany)
Description
The advent of high performance 3rd generation synchrotron sources boosted progress of computer tomographic research towards larger energies and higher resolution. To surpass present limitations in resolution (>1 μm) and efficiency (a few %) proceeding to higher energies, we have developed a innovative technique using 2 extremely asymmetrical Bragg crystals for X-ray imaging and magnification. The device yields distortion and aberration free images and near-field holograms with magnification factors up to 250x250 at X-ray energies around 22 keV with drastically increased efficiency. In conjunction with the X-ray sensing pixel detector PILATUS the total efficiency could be further improved. Thus even at highest magnification factors exposure times of a few msec could be achieved
Additional details
Identifiers
- DOI
- 10.1016/j.radphyschem.2005.11.017;
- PII
- S0969-806X(06)00292-1;
Publishing Information
- Journal Title
- Radiation Physics and Chemistry (1993)
- Journal Volume
- 75
- Journal Issue
- 11
- Journal Page Range
- p. 1956-1961
- ISSN
- 0969-806X
- CODEN
- RPCHDM
Conference
- Title
- 20. international conference on X-ray and inner-shell processes
- Dates
- 4-8 Jul 2005
- Place
- Melbourne (Australia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38040135
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BRAGG REFLECTION; EFFICIENCY; HOLOGRAPHY; IMAGES; KEV RANGE 10-100; PERFORMANCE; SYNCHROTRON RADIATION SOURCES; X RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; RADIATION SOURCES; RADIATIONS; REFLECTION
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.