Refractive index measurement of low concentration solution based on surface plasmon resonance and dual-frequency laser interferometric phase detection
Creators
- 1. School of Mechanical Engineering, Beijing Institute of Technology, Beijing 100081 (China)
Description
A solution refractive index (SRI) is one of the key parameters to indicate important information of materials such as optical properties, solute composition and so on. Samples are usually made of low concentration solutions, so that some properties and parameters can be determined by detecting SRI variations in chemical or physical reactions. In this connection, a kind of SRI measurement method based on surface plasmon resonance (SPR) and dual-frequency laser interferometric phase detection is presented. The theoretical model based on the Kretschmann excitation structure shows the variation of phase difference between p and s polarization components of the reflected light is approximately linear with SRI at the range of 1.333–1.336 RIU. The measurement formula is derived and corresponding experimental system is built based on the heterodyne interference optical path by using a dual-frequency laser. Error analysis shows the maximum value of the measurement uncertainty is less than 3.0 × 10−5. The experiment results of measuring glycerine solution refractive index agree with the theoretical analysis. Comparison results show the measurement differentia between the presented method and the formula by Abbe refractometer is less than 2.0 × 10−5. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6501/28/1/015011Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 28
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49031953
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- APPROXIMATIONS; CONCENTRATION RATIO; ERRORS; EXCITATION; INTERFERENCE; INTERFEROMETERS; INTERFEROMETRY; LASERS; PLASMONS; POLARIZATION; REFRACTIVE INDEX; RESONANCE; SOLUTES; SURFACES; VARIATIONS
- Descriptors DEC
- CALCULATION METHODS; DIMENSIONLESS NUMBERS; ENERGY-LEVEL TRANSITIONS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; QUASI PARTICLES