Enhanced sputter yields of ion irradiated Au nano particles: energy and size dependence
Creators
- 1. Institute for Solid State Physics, Friedrich Schiller University Jena, Max-Wien-Platz 1, D-07743 Jena (Germany)
- 2. Department of New Materials and Biosystems, Max Planck Institute for Intelligent Systems, Heisenbergstr. 3, D-70569 Stuttgart (Germany)
Description
Hexagonally arranged Au nanoparticles exhibiting a broad Gaussian-shaped size distribution ranging from 30 nm to 80 nm were deposited on Si substrates and irradiated with Ar+ and Ga+ ions with various energies from 20 to 350 keV and 1 to 30 keV, respectively. The size and energy dependence of the sputter yield were measured using high-resolution scanning electron microscopy image analysis. These results were compared to simulation results obtained by iradina, a Monte Carlo code, which takes the specifics of the nano geometry into account. The experimental sputter yields are significantly higher than simulated sputter yields for both bulk and the nano geometry. The difference can be clearly attributed to thermally driven effects, which significantly increase the measured sputter yields. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/26/32/325301Additional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 26
- Journal Issue
- 32
- Journal Page Range
- [7 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48004760
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ARGON IONS; COMPARATIVE EVALUATIONS; ENERGY DEPENDENCE; EXPERIMENTAL DATA; GALLIUM IONS; IRRADIATION; KEV RANGE 100-1000; KEV RANGE 10-100; MONTE CARLO METHOD; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; SPUTTERING; YIELDS
- Descriptors DEC
- CALCULATION METHODS; CHARGED PARTICLES; DATA; ELECTRON MICROSCOPY; ENERGY RANGE; EVALUATION; INFORMATION; IONS; KEV RANGE; MICROSCOPY; NUMERICAL DATA; PARTICLES