Study and measurements of the noise components in the charge sensitive preamplifier

The report describes the electronic noise sources inside the preamplifier. These sources result mainly from the preamplifier first stage which contains JFET transistors. In the first part of the report, the different noise sources have been described with their parameters. The mathematical model, to Equivalent Noise Charge (ENC) value has been presented. In the second part, many measurements were carried out to calculate the ENC. from the experimental data, we have extracted the noise components i. e. series and parallel noise. Finally a comparison between the theoretical model and the experimental data has been successfully sustained. (author)