Published June 2006 | Version v1
Journal article Metadata-only

Extending quantitative mass spectrometry to the nanoscale

Creators

  • 1. Materials Science Division, Argonne National Lab., Argonne (United States)

Description

The actual problems of quantitative mass spectroscopy of nanostructures are discussed. The characteristics of the laser postionization secondary neutral mass spectroscopy (LPI-SNMS) are compared with performances of well-known mass spectroscopic methods.The example of using potentials of the LPI-SNMS spectrometer for quantitative chemical analysis of nanostructures (in particular its efficiency and mass resolution) is presented

Abstract (Russian)

Обсуждаются актуальные проблемы количественной масс-спектроскопии для наноструктур. Характеристики лазерной постионизационной вторичной нейтральной масс-спектроскопии (ЛПИ-ВНМС) сравниваются с характеристиками хорошо известных масс-спектроскопических методов. Приведен пример использования возможностей ЛПИ-ВНМС масс-спектрометра (его эффективности и разрешения по массе) для количественного химического анализа наноструктур

Additional details

Publishing Information

Journal Title
Izvestiya Akademii Nauk. Rossijskaya Akademiya Nauk. Seriya Fizicheskaya
Journal Volume
70
Journal Issue
6
Journal Page Range
p. 859-861
ISSN
1026-3489
CODEN
IRAFEO

Conference

Title
XVII International conference Ion-surface interaction
Original Conference Title
XVII Mezhdunarodnaya konferentsiya Vzaimodejstvie ionov s poverkhnost'yu (VIP-2005)
Dates
Aug 2005
Place
Zvenigorod (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
38046774
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
EFFICIENCY; LASER RADIATION; MASS RESOLUTION; MASS SPECTROSCOPY; NANOSTRUCTURES; PHOTOIONIZATION; QUANTITATIVE CHEMICAL ANALYSIS; TIME-OF-FLIGHT SPECTROMETERS; USES
Descriptors DEC
CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; IONIZATION; MEASURING INSTRUMENTS; RADIATIONS; RESOLUTION; SPECTROMETERS; SPECTROSCOPY

Optional Information

Notes
8 refs., 1 fig.