Changes of morphological, optical, and electrical properties induced by hydrogen plasma on (0001) ZnO surface
Creators
- 1. FZU - Institute of Physics, Czech Academy of Sciences, Praha (Czech Republic)
- 2. Faculty of Electrical Engineering, Czech Technical University in Prague (Czech Republic)
- 3. SVCS Process Innovation s.r.o., Valašské Meziříčí (Czech Republic)
- 4. Institute of Chemistry, Slovak Academy of Sciences, Bratislava (Slovakia)
- 5. Department of Applied Physics, National Pingtung University, Pingtung (China)
Description
Plasma provides specific adjustment of solid-state surface properties offering an alternative to high temperature treatment. Herein, hydrogen plasma treatment of monocrystalline (0001) ZnO surface is studied in an inductively coupled plasma reactor with reduced capacitively coupled plasma mode. The crucial role of electrical grounding of the sample holder for plasma etching and related changes in the morphology, optical, and electrical properties of surfaces exposed to electron and ion bombardment are explained. The effects on the chemical composition of the surface are analyzed by X-ray photoelectron spectroscopy (XPS), optical properties by photoluminescence spectroscopy, topography, roughness, and surface measurements by atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM). All methods show altered ZnO surface properties before and after plasma treatment strongly depending on the electrical potential of the holder. (© 2021 Wiley‐VCH GmbH)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.202100427Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 219
- Journal Issue
- 16
- Journal Page Range
- p. 1-7
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 53102574
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; ELECTRICAL PROPERTIES; ETCHING; HYDROGENATION; ION BEAMS; MONOCRYSTALS; MORPHOLOGY; PHOTOLUMINESCENCE; PLASMA; ROUGHNESS; SAMPLE HOLDERS; SURFACE POTENTIAL; WORK FUNCTIONS; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHEMICAL REACTIONS; CRYSTALS; ELECTRON SPECTROSCOPY; EMISSION; FUNCTIONS; LUMINESCENCE; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHOTON EMISSION; PHYSICAL PROPERTIES; POTENTIALS; SPECTROSCOPY; SURFACE FINISHING; SURFACE PROPERTIES; ZINC COMPOUNDS
Optional Information
- Notes
- AID: 2100427