Study of characteristic for secondary electron emission of dielectric with different surface chargings

The secondary electron emission (SEE) process is very important for spacecraft surface charged rate and balanced potential. The SEE coefficients (δ) of kapton, cover glass and optical solar reflector (OSR) materials were measured with 1.5 keV pulsed electron irradiation, and the SEE yield of dielectric material with different surface charges was investigated. The results indicate that the SEE yield is observed to be larger at lower projectile energy in the region of 1.5 keV. The SEE coefficients decrease with positive charging of dielectric when δ is more than 1 and increase with negative charging of dielectric when δ is lower than 1. (authors)