Characterization of Al-doped spinel LiMn2O4 thin film cathode electrodes prepared by Liquid Source Misted Chemical Deposition (LSMCD) technique
Description
A novel process called Liquid Source Misted Chemical Deposition (LSMCD) was used to synthesize Al-doped LiMn2O4 cathode films for Lithium microbatteries. The cathode films were characterized by XRD, SEM, cyclic volatmmetry, and charge/discharge test. LiMn1.8Al0.2O4 film crystallized at 800 deg. C in rapid thermal annealing (RTA) for 5 min under oxygen atmosphere exhibited more improved electrochemical rechargeability than spinel LiMn2O4 film because the substitution of Al3+ for Mn3+ increased Mn-O bonding strength in the spinel framework and suppressed the two-phase behavior of the unsubstituted spinel during the intercalation/deintercalation that is the origin of the failure mechanism in the 4 V region. As a result, LiMn1.8Al0.2O4 film showed an initial discharge capacity of 52 μAh/cm2 μm and no capacity fade over 100 cycles
Additional details
Identifiers
- DOI
- 10.1016/S0013-4686(03)00608-X;
- arXiv
- arXiv:cond-mat/0211600v3;
- PII
- S001346860300608X;
Publishing Information
- Journal Title
- Electrochimica Acta
- Journal Volume
- 48
- Journal Issue
- 28
- Journal Page Range
- p. 4223-4231
- ISSN
- 0013-4686
- CODEN
- ELCAAV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38008515
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ALUMINIUM IONS; ANNEALING; CAPACITY; CATHODES; CHEMICAL BONDS; DEPOSITION; DOPED MATERIALS; LITHIUM OXIDES; MANGANESE IONS; MANGANESE OXIDES; SCANNING ELECTRON MICROSCOPY; SPINELS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRODES; ELECTRON MICROSCOPY; FILMS; HEAT TREATMENTS; IONS; LITHIUM COMPOUNDS; MANGANESE COMPOUNDS; MATERIALS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.