Published May 2005 | Version v1
Journal article

Influence of the barrier thickness on the photoluminescence properties of amorphous Si/SiO multilayers

  • 1. Laboratoire de Physique des Materiaux (U.M.R. C.N.R.S. No 7556), Universite Henri Poincare Nancy 1, B.P. 239, 54506 Vandoeuvre-les-Nancy Cedex (France)

Description

Amorphous Si/SiO multilayers have been prepared at 100 deg C by successive evaporations of pure silicon and a silicon oxide powder. The silicon thickness is equal to 6 A and the influence of the barrier thickness is investigated. Photoluminescence in the visible range was observed at room temperature for a barrier thickness greater or equal to 16 A. Two contributions at 550 and 750 nm are distinguishable. The band at 550 nm is attributed to the silicon oxide layer whereas the photoluminescence at 750 nm is attributed to three dimensionally confined amorphous silicon clusters, which originates from the discontinuity of the amorphous silicon layers

Additional details

Identifiers

DOI
10.1016/j.jlumin.2004.08.053;
PII
S0022-2313(04)00306-0;

Publishing Information

Journal Title
Journal of Luminescence
Journal Volume
113
Journal Issue
1-2
Journal Page Range
p. 64-68
ISSN
0022-2313
CODEN
JLUMA8

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37056807
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
EVAPORATION; LAYERS; PHOTOLUMINESCENCE; SILICON; SILICON OXIDES; THICKNESS
Descriptors DEC
CHALCOGENIDES; DIMENSIONS; ELEMENTS; EMISSION; LUMINESCENCE; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOTON EMISSION; SEMIMETALS; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.