Published May 2005
| Version v1
Journal article
Influence of the barrier thickness on the photoluminescence properties of amorphous Si/SiO multilayers
Creators
- 1. Laboratoire de Physique des Materiaux (U.M.R. C.N.R.S. No 7556), Universite Henri Poincare Nancy 1, B.P. 239, 54506 Vandoeuvre-les-Nancy Cedex (France)
Description
Amorphous Si/SiO multilayers have been prepared at 100 deg C by successive evaporations of pure silicon and a silicon oxide powder. The silicon thickness is equal to 6 A and the influence of the barrier thickness is investigated. Photoluminescence in the visible range was observed at room temperature for a barrier thickness greater or equal to 16 A. Two contributions at 550 and 750 nm are distinguishable. The band at 550 nm is attributed to the silicon oxide layer whereas the photoluminescence at 750 nm is attributed to three dimensionally confined amorphous silicon clusters, which originates from the discontinuity of the amorphous silicon layers
Additional details
Identifiers
- DOI
- 10.1016/j.jlumin.2004.08.053;
- PII
- S0022-2313(04)00306-0;
Publishing Information
- Journal Title
- Journal of Luminescence
- Journal Volume
- 113
- Journal Issue
- 1-2
- Journal Page Range
- p. 64-68
- ISSN
- 0022-2313
- CODEN
- JLUMA8
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37056807
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- EVAPORATION; LAYERS; PHOTOLUMINESCENCE; SILICON; SILICON OXIDES; THICKNESS
- Descriptors DEC
- CHALCOGENIDES; DIMENSIONS; ELEMENTS; EMISSION; LUMINESCENCE; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOTON EMISSION; SEMIMETALS; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.