Structural, optical and galvanomagnetic properties of nanocrystalline Se_51.43In_44.67Pb_3.9 thin films

Se_51.43In_44.67Pb_3.9 nanocrystalline thin films were prepared by thermal evaporation. The composition of those films was detected by energy dispersive x-ray analysis (EDAX). The structural, optical and galvanomagnetic properties of these films have been investigated. The structural properties were investigated by high-resolution transmission electron microscopy (HRTEM) and x-ray diffraction (XRD). HRTEM micrograph shows a continuous matrix through which the nanoparticles with a diameter ranging from 3 to 9 nm are embedded. The x-ray diffraction pattern shows a hump around a diffraction angle 2θ  =  27.95°, which corresponds to the highest intensity (1 0 1) plane. The optical energy band gap of the evaporated films was determined as 1.16 eV. The electrical conductivity, charge carriers concentration, carriers mobility and the magnetoresistance of the films were investigated as a function of temperature. (paper)