Published March 2013 | Version v1
Journal article

An 8-bit 100-MS/s digital-to-skew converter embedded switch with a 200-ps range for time-interleaved sampling

  • 1. State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203 (China)

Description

A sampling switch with an embedded digital-to-skew converter (DSC) is presented. The proposed switch eliminates time-interleaved ADCs' skews by adjusting the boosted voltage. A similar bridged capacitors' charge sharing structure is used to minimize the area. The circuit is fabricated in a 0.18 μm CMOS process and achieves sub-1 ps resolution and 200 ps timing range at a rate of 100 MS/s. The power consumption is 430 μW at maximum. The measurement result also includes a 2-channel 14-bit 100 MS/s time-interleaved ADCs (TI-ADCs) with the proposed DSC switch's demonstration. This scheme is widely applicable for the clock skew and aperture error calibration demanded in TI-ADCs and SHA-less ADCs. (semiconductor integrated circuits)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/34/3/035003

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
34
Journal Issue
3
Journal Page Range
[5 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44061409
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ANALOG-TO-DIGITAL CONVERTERS; CALIBRATION; CALORIMETRY; INTEGRATED CIRCUITS; SAMPLING; SEMICONDUCTOR MATERIALS; SWITCHES
Descriptors DEC
ELECTRICAL EQUIPMENT; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MATERIALS; MICROELECTRONIC CIRCUITS