Published October 1, 2008
| Version v1
Journal article
(Bi0.5Na0.5)0.93Ba0.07TiO3 lead-free ceramics with addition of Ga2O3
Creators
- 1. Department of Chemical Engineering, National Cheng Kung University, Tainan 701, Taiwan (China)
Description
As a candidate of a lead-free (Bi0.5Na0.5TiO3)0.93(BaTiO3)0.07+ x wt% Ga2O3 with x=0.0-0.2 has been synthesized by solid-state sintering ceramic-fabrication technique. The effect of Ga2O3 addition with ceramics enhanced the dielectric constant of free (Bi0.5Na0.5TiO3)0.93(BaTiO3)0.07+ x wt% Ga2O3 ceramics significantly. At room temperature, the dielectric constant is increased and relatively low dielectric loss occurred at high frequencies. X-ray diffraction pattern showed that the coexistence of tetragonal and rhombohedral phases in the (Bi0.5Na0.5TiO3)0.93(BaTiO3)0.07 composition was not changed by adding Ga2O3
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2008.05.039Additional details
Identifiers
- DOI
- 10.1016/j.physb.2008.05.039;
- PII
- S0921-4526(08)00255-X;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 403
- Journal Issue
- 19-20
- Journal Page Range
- p. 3596-3598
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40049597
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BARIUM COMPOUNDS; BISMUTH COMPOUNDS; CERAMICS; DIELECTRIC MATERIALS; GALLIUM OXIDES; LEAD; LOSSES; PERMITTIVITY; SINTERING; SODIUM COMPOUNDS; SOLIDS; TEMPERATURE RANGE 0273-0400 K; TITANATES; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ELEMENTS; FABRICATION; GALLIUM COMPOUNDS; MATERIALS; METALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TEMPERATURE RANGE; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.