Published March 31, 2016 | Version v1
Journal article

Electro-deposition as a repair method for embedded metal grids

  • 1. Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG, Groningen (Netherlands)
  • 2. Holst Centre/TNO, High Tech Campus 31, 5605 KN Eindhoven (Netherlands)
  • 3. Max Planck Institute für Polymerforschung, Ackermannweg 10, 55128 Mainz (Germany)

Description

A method is presented to self-repair cracks in embedded silver grid structures used in large area organic electronics. The repair procedure is based on electro-deposition, incited by the application of a moderate DC voltage across the crack. During this process the organic anode that is in direct electrical contact with the silver grid, functions as an appropriate medium for ion migration. Restoration of conductivity is achieved by the formation of dendritic metal structures that connect the cathodic to the anodic side of the crack. The metal dendrites decrease the gap resistance by one order of magnitude. Subsequently, another three orders of magnitude are gained upon sintering the dendrites using a high voltage pulse, yielding restored conductance levels nearly within one order of magnitude difference from native track conductance. - Highlights: • An innovative method to repair cracks in embedded silver electrodes is presented. • The method targets application in flexible hybrid- and organic electronics. • The mechanism relies on dendritic growth of metallic structures. • Sintering yields restored conductivity levels approaching the original value.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2016.01.060

Additional details

Identifiers

DOI
10.1016/j.tsf.2016.01.060;
PII
S0040-6090(16)00099-7;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
603
Journal Page Range
p. 202-205
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.