Published May 1970
| Version v1
Report
Scanning electron microscopy
Description
The JSM-11 scanning electron microscope at CRNL has been used extensively for topographical studies of oxidized metals, fracture surfaces, entomological and biological specimens. A non-dispersive X-ray attachment permits the microanalysis of the surface features. Techniques for the production of electron channeling patterns have been developed. (author)
Additional details
Publishing Information
- Imprint Title
- Materials research in AECL, Spring 1970
- Imprint Pagination
- 22 p.
- Journal Page Range
- p. 12-14
- Report number
- AECL--3604
INIS
- Country of Publication
- Canada
- Country of Input or Organization
- Canada
- INIS RN
- 37078962
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHALK RIVER NUCLEAR LABS; FRACTURES; METALS; OXIDATION; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; TOPOGRAPHY
- Descriptors DEC
- ATOMIC ENERGY OF CANADA LTD; CANADIAN ORGANIZATIONS; CHEMICAL REACTIONS; ELECTRON MICROSCOPY; ELEMENTS; FAILURES; MICROSCOPY; NATIONAL ORGANIZATIONS
Optional Information
- Notes
- 9 refs., 4 figs.