Published June 2010 | Version v1
Journal article

X-ray structural study of intermetallic alloys RT2Si and RTSi2 (R=rare earth, T=noble metal)

  • 1. Chemistry Department of the Moscow State University, Leninskie Gory, GSP-1, 119991 Moscow (Russian Federation)
  • 2. Institute of Physical Chemistry, University of Vienna, Waehringerstrasse 42, A-1090 Wien (Austria)
  • 3. Institute of Mineralogy and Crystallography, University of Vienna, Althanstrasse 14, A-1090 Wien (Austria)

Description

Two series of intermetallic alloys, RT2Si and RTSi2, have been synthesized from stoichiometric compositions. The crystal structures of EuPt1+xSi2-x (CeNiSi2-type), CeIr2Si (new structure type), YbPd2Si and YbPt2Si (both YPd2Si-type) have been elucidated from X-ray single crystal CCD data, which were confirmed by XPD experiments. The crystal structures of LaRh2Si and LaIr2Si (CeIr2Si-type), {La,Ce,Pr,Nd}AgSi2 (all TbFeSi2-type), and EuPt2Si (inverse CeNiSi2-type) were characterized by XPD data. RT2Si/RTSi2 compounds were neither detected in as-cast alloys Sc25Pt50Si25, Eu25Os25Si50 and Eu25Rh25Si50 nor after annealing at 900 oC. Instead, X-ray single crystal data prompted Eu2Os3Si5 (Sc2Fe3Si5-type) and EuRh2+xSi2-x (x=0.04, ThCr2Si2-type) as well as a new structure type for Sc2Pt3Si2 (own type). - Graphical abstract: Two series of the intermetallic compounds, RT2Si and RTSi2, have been investigated by X-ray diffraction methods. The new tetragonal CeIr2Si-type of the crystal structure was described and the interrelation between orthorhombic CeNiSi2 and tetragonal CeIr2Si had been discussed as a similar packing of the BaAl4 and AlB2 slabs.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jssc.2010.03.038

Additional details

Identifiers

DOI
10.1016/j.jssc.2010.03.038;
PII
S0022-4596(10)00128-3;

Publishing Information

Journal Title
Journal of Solid State Chemistry
Journal Volume
183
Journal Issue
6
Journal Page Range
p. 1278-1289
ISSN
0022-4596
CODEN
JSSCBI

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.