Resonant X-ray emission spectroscopy of liquid water: Novel instrumentation, high resolution, and the 'map' approach
Creators
- 1. Department of Chemistry, University of Nevada, Las Vegas, NV 89154-4003 (United States)
- 2. Universitaet Wuerzburg, Experimentelle Physik II, Am Hubland, 97074 Wuerzburg (Germany)
- 3. Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States)
- 4. Angewandte Physikalische Chemie, Universitaet Heidelberg, INF 253, 69120 Heidelberg (Germany)
Description
Techniques to study the electronic structure of liquids are rare. Most recently, resonant X-ray emission spectroscopy (XES) has been shown to be an extremely versatile spectroscopy to study both occupied and unoccupied electronic states for liquids in thermodynamic equilibrium. However, XES requires high-brilliance soft X-ray synchrotron radiation and poses significant technical challenges to maintain a liquid sample in an ultra-high vacuum environment. Our group has therefore developed and constructed a novel experimental setup for the study of liquids, with the long-term goal of investigating the electronic structure of biological systems in aqueous environments. We have developed a flow-through liquid cell in which the liquid is separated from vacuum by a thin Si3N4 or SiC window and which allows a precise control of temperature. This approach has significant advantages compared to static liquids cells used in the past. Furthermore, we have designed a dedicated high-transmission, high-resolution soft X-ray spectrometer. The high transmission makes it possible to measure complete resonant XES 'maps' in less than an hour, giving unprecedented detailed insight into the electronic structure of the investigated sample. Using this new equipment we have investigated the electronic structure of liquid water. Furthermore, our XES spectra and maps give information about ultra-fast dissociation on the timescale of the O 1s core hole lifetime, which is strongly affected by the initial state hydrogen bonding configuration.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2009.02.014Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2009.02.014;
- PII
- S0368-2048(09)00055-3;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 177
- Journal Issue
- 2-3
- Journal Page Range
- p. 206-211
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41085660
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ABSORPTION; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; HYDROGEN; LIQUIDS; SILICON CARBIDES; SILICON NITRIDES; SOFT X RADIATION; SPECTRA; SPECTROMETERS; SYNCHROTRON RADIATION; WATER
- Descriptors DEC
- BREMSSTRAHLUNG; CARBIDES; CARBON COMPOUNDS; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; HYDROGEN COMPOUNDS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; OXYGEN COMPOUNDS; PNICTIDES; RADIATIONS; SILICON COMPOUNDS; SORPTION; SPECTROSCOPY; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.