Controlled p-type to n-type conductivity transformation in NiO thin films by ultraviolet-laser irradiation
- 1. Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27606 (United States)
Description
We report the systematic changes in structural, electrical, and optical properties of NiO thin films on c-sapphire introduced by nanosecond ultraviolet excimer laser pulses. Epitaxial nature of as deposited NiO was determined by x-ray diffraction phi scans and transmission electron microscopy (TEM) and it was established that NiO film growth takes place with twin domains on sapphire where two types of domains have 60 deg. in-plane rotation with respect to each other about the [111] growth direction. We determined that at pulsed laser energy density of 0.275 J/cm2, NiO films exhibited conversion from p-type semiconducting to n-type conductive behavior with three orders of magnitude decrease in resistivity, while maintaining its cubic crystal structure and good epitaxial relationship. Our TEM and electron-energy-loss spectroscopy studies conclusively ruled out the presence of any Ni clustering or precipitation due to the laser treatment. The laser-induced n-type carrier transport and conductivity enhancement were shown to be reversible through subsequent thermal annealing in oxygen. This change in conductivity behavior was correlated with the nonequilibrium concentration of laser induced Ni0-like defect states.
Additional details
Identifiers
- DOI
- 10.1063/1.3671412;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 111
- Journal Issue
- 1
- Journal Page Range
- p. 013706-013706.7
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43129219
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ENERGY DENSITY; ENERGY-LOSS SPECTROSCOPY; EPITAXY; EXCIMER LASERS; LASER RADIATION; NICKEL OXIDES; N-TYPE CONDUCTORS; OPTICAL PROPERTIES; PRECIPITATION; P-TYPE CONDUCTORS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; FILMS; GAS LASERS; HEAT TREATMENTS; LASERS; MATERIALS; MICROSCOPY; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SEMICONDUCTOR MATERIALS; SEPARATION PROCESSES; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2012 American Institute of Physics