Measurement of bound electron Compton scattering with fluorescence coincidence detection

At low incident energy Compton scattering from bound electrons deviates significantly from free electron Compton scattering. In the present measurement, intensity of K-shell Compton scattered gamma rays from tin is measured with fluorescence coincidence detection. Two NaI(Tl) scintillation spectrometers working in coincidence with a resolving time of 25 nanoseconds are used to record the events. Contribution due to Bremsstrahlung and x-ray production by Compton and photoelectrons is minimized using thin target of tin. The measured results are compared with the available theoretical and experimental data. (author). 7 refs., 1 tab