Published November 1, 2019
| Version v1
Journal article
Optical confocal spectroscopy of SiC and AlN interfaces using Raman scattering and Optically Detected Magnetic Resonance
- 1. Ioffe Physical Institute, St. Petersburg (Russian Federation)
Description
The thesis contains the investigation of transition layer between AlN and SiC and the investigation of AlN Raman peaks evolution with distance till interface. Moreover, ODMR spatial research of nonuniformly irradiated 4H-SiC was performed together with PL spatial spectroscopy. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1400/6/066018Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1400
- Journal Issue
- 6
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- International Conference PhysicA.SPb/2019
- Dates
- 22-24 Oct 2019
- Place
- Saint Petersburg (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53072960
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM NITRIDES; IRRADIATION; LAYERS; MAGNETIC RESONANCE; RAMAN EFFECT; SILICON CARBIDES; SPECTROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CARBIDES; CARBON COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; RESONANCE; SILICON COMPOUNDS