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Published April 2020 | Version v1
Journal article

Method of electron affinity evaluation for the type-2 InAs/InAs1−xSbx superlattice

  • 1. Military University of Technology. Institute of Applied Physics (Poland)
  • 2. VIGO System S.A. (Poland)

Description

The type-2 InAs/InAs1−xSbx superlattices on GaAs substrate with GaSb buffer layer were investigated by comparison of theoretical simulations and experimental data. The algorithm for selection of input parameters (binary and ternary materials) for simulations is presented. We proposed the method of the bandgap energy extraction of the absorption curve. The correct choice of the bulk materials and bowing parameters for the ternary alloys allows to reach good agreement of the experimental data and theoretical approach. One of the key achievements of this work was an electron affinity assessment for the device's theoretical simulation. The detectivity of the long-/very long-wave InAs/InAs1−xSbx superlattice photoconductors at the level of ~ 8 × 109 cm Hz1/2/W (cutoff wavelength 12 µm) and ~ 9 × 108 cm Hz1/2/W (cutoff wavelength 18 µm) at a temperature 230 K confirmed the good quality of these materials.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Materials Science
Journal Volume
55
Journal Issue
12
Journal Page Range
p. 5135-5144
ISSN
0022-2461
CODEN
JMTSAS

Optional Information

Copyright
Copyright (c) 2020 © The Author(s) 2020