Published November 20, 1986 | Version v1
Patent

Method of measuring multiplication factors of subcritical assemblies

Description

Purpose: To simplify the operation of preparing a calibration curve in a method of measuring multiplication factors in the subcritical system of fuel assemblies. Method: For the measurement of effective neutron multiplication factors in a subcritical system such as fuel assemblies, subcritical systems having two known values greatly different from each other is required. However, such conditions are not easily realized in a facility, for example, a spent fuel receiving pool. In view of the above, a neutron source is disposed on one side and a neutron detector is disposed on the other side of a subcritical system placed in water. A measuring system in which the compensating factor takes a value of about 1.0 independent of the effective neutron multiplication factor is previously determined by simulated experiment or analysis. Then, the effective neutron multiplication factor is determined based on the neutron fluxes in the subcritical system measured under the same conditions as those in the thus obtained measuring system. While two standard subcritical systems with the effective neutron multiplication factors being greatly different from each other have been required, a calibration curve can be prepared using only one known standard system and the value can be determined with ease. (Kamimura, M.)

Availability note (English)

Available from JAPIO. Also available from INPADOC.

Additional details

Publishing Information

Imprint Pagination
4 p.
IPC:
Int. Cl. G21C17/06.
IPC
Int. Cl. G21C17/06.
Patent number
JP patent document 61-262691/A/

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
18069754
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
CALIBRATION STANDARDS; CORRECTIONS; FUEL REPROCESSING PLANTS; MULTIPLICATION FACTORS; NEUTRON DETECTORS; NEUTRON FLUX; NEUTRON SOURCES; SIMULATION; SUBCRITICAL ASSEMBLIES
Descriptors DEC
EXPERIMENTAL REACTORS; MEASURING INSTRUMENTS; NUCLEAR FACILITIES; PARTICLE SOURCES; RADIATION DETECTORS; RADIATION FLUX; RADIATION SOURCES; REACTORS; RESEARCH AND TEST REACTORS

Optional Information

Secondary number(s)
JP patent application 60-104597.