Published August 2016 | Version v1
Miscellaneous Metadata-only

Measurement of femtosecond electron beam using interferometer and photoconductive antenna

Creators

  • 1. Osaka University, Institute of Scientific and Industrial Research (ISIR), Ibaraki, Osaka (Japan)

Description

Generation of femtosecond electron bunches has been investigated for a light source based on electron bunches and improvement of time resolution in time-resolved measurements. In this study, characterization of THz pulse emitted from femtosecond electron bunch was conducted. THz pulses of coherent transition radiation (CTR) were generated by the electron bunches. Combining a Michelson interferometer and a photoconductive antenna (PCA) enabled frequency and time-domain measurement of THz pulses from electron bunches, respectively. In the experiment, CTR was separated by a beam splitter and transported to the interferometer and PCA. (author)

Part of:
Proceedings of the 13th annual meeting of Particle Accelerator Society of Japan

Additional details

Identifiers

URL
http://www.pasj.jp/web_publish/pasj2016/proceedings/index.html;

Publishing Information

Imprint Title
Proceedings of the 13th annual meeting of Particle Accelerator Society of Japan
Imprint Pagination
1420 p.
Journal Page Range
p. 1012-1015

Conference

Title
13. annual meeting of Particle Accelerator Society of Japan
Acronym
PASJ2016
Dates
8-10 Aug 2016
Place
Chiba (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
48071080
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ANTENNAS; BEAM BUNCHERS; COHERENT RADIATION; ELECTRIC FIELDS; ELECTRON BEAMS; ELECTRON GUNS; LIGHT SOURCES; LINEAR ACCELERATORS; MICHELSON INTERFEROMETER; PHOTOCURRENTS; PULSED IRRADIATION; SPACE CHARGE; TIME RESOLUTION; TRANSITION RADIATION
Descriptors DEC
ACCELERATORS; BEAMS; CURRENTS; ELECTRIC CURRENTS; ELECTRICAL EQUIPMENT; ELECTROMAGNETIC RADIATION; EQUIPMENT; INTERFEROMETERS; IRRADIATION; LEPTON BEAMS; MEASURING INSTRUMENTS; PARTICLE BEAMS; RADIATION SOURCES; RADIATIONS; RESOLUTION; TIMING PROPERTIES

Optional Information

Notes
26 refs., 2 figs.