Energy dependence of photon-induced Kα and Kβ x-ray production cross-sections for some elements with 42≤Z≤68 in the energy range 38–80 keV
Creators
- 1. Department of Physics, Faculty of Education, Atatürk University, 25240 Erzurum (Turkey)
- 2. Department of Physics, Faculity of Science and Arts, Pamukkale University, Denizli (Turkey)
Description
The energy dependence of photon-induced Kα and Kβ x-ray production cross-sections for Mo, Ru, Pd, In, Sb, Cs, La, Pr, Sm, Tb and Er elements has been studied in the energy range of 38–80 keV with secondary excitation method. K x-ray intensities were measured using Energy Dispersive X-Ray Fluorescence (EDXRF) Spectrometry. The measurements have been made by observing the x-ray emissions, with the help of HPGe detector coupled with a multichannel analyzer. The areas of the Kα and Kβ spectral peaks, as well as the net peak areas, have been determined by a fitting process. The measured Kα and Kβ x-ray production cross-sections have been compared with calculated theoretical values in this energy regime. The results have been plotted versus excitation energy. The present experimental Kα and Kβ x-ray production cross-section values for all the elements were in general agreement with the theoretical values calculated using photoionization cross-sections, fluorescence yields and fractional rates based on Hartree–Slater potentials. - Highlights: • The incident photon energy dependence of K x-rays production cross-sections of elements with 42≤Z≤68 was studied. • The experiments were performed for in the incident photon energy range 38–80 keV. • The K x-rays emitted from the elements were counted by HPGe detector coupled with a multichannel analyzer. • The intensity of K x-rays of secondary exciter sample falling on primary target (I0G) estimated using the L x-rays production cross-sections of Th and U. • The cross-sections decrease with increase in incident photon energy. • The experimental values are in agreement with theoretical calculated values.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.radphyschem.2015.07.005Additional details
Identifiers
- DOI
- 10.1016/j.radphyschem.2015.07.005;
- PII
- S0969-806X(15)30012-8;
Publishing Information
- Journal Title
- Radiation Physics and Chemistry (1993)
- Journal Volume
- 117
- Journal Page Range
- p. 1-6
- ISSN
- 0969-806X
- CODEN
- RPCHDM
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49054862
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- CROSS SECTIONS; ENERGY DEPENDENCE; HIGH-PURITY GE DETECTORS; KEV RANGE 10-100; MULTI-CHANNEL ANALYZERS; PHOTONS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BOSONS; CHEMICAL ANALYSIS; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; ENERGY RANGE; EQUIPMENT; GE SEMICONDUCTOR DETECTORS; KEV RANGE; MASSLESS PARTICLES; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; PULSE ANALYZERS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.