Published June 21, 2015 | Version v1
Journal article

Radon irradiation chamber and its applications

  • 1. Promising Centre for Sensors and Electronic Devices, Najran University, Najran 1101 (Saudi Arabia)
  • 2. Department of Physics, Faculty of Arts and Sciences, Najran University, Najran (Saudi Arabia)

Description

An irradiation radon chamber with a total volume of 87 l was designed and constructed. This system is based on a natural radon source and a traceable reference radon detector (AB-5 Radon monitor), which allows the radon concentrations inside the chamber to be obtained in different ranges. The radon chamber was used to determine both the calibration factor of the radon detector and the equilibrium factor between radon and its short-lived daughters. In addition, the dependence of the equilibrium factor on the temperature and flow rate was studied. The equilibrium factor was observed to be linearly dependent on the flow rate and its value at 20 °C was found to be 2.2 times higher than the equilibrium factor value at 50 °C. These values are in good agreement with those reported using the surface barrier detector method

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2015.03.043

Additional details

Identifiers

DOI
10.1016/j.nima.2015.03.043;
PII
S0168-9002(15)00360-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
786
Journal Page Range
p. 78-82
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47027593
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CALIBRATION; DESIGN; EMANOMETERS; EQUILIBRIUM; FLOW RATE; IRRADIATION; RADON; SURFACE BARRIER DETECTORS
Descriptors DEC
ELEMENTS; FLUIDS; GASES; MEASURING INSTRUMENTS; NONMETALS; RADIATION DETECTORS; RARE GASES; SEMICONDUCTOR DETECTORS

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.