Published October 26, 1993
| Version v1
Journal article
Measurement of SHF penetration depth in YBa2Cu3O7-x films in constant magnetic field
Description
Dependences of depth of electromagnetic field penetration into YBa2Cu3O7-x films of different thickness on constant magnetic field H (up to 1.4 ke) at 60 GHz frequency were obtained on the basis of measured shift of resonance frequency Δf(H) and dependence of surface resistance R(H) at T=4.2 K
Additional details
Additional titles
- Original title (Russian)
- Измерение глубины проникновения на SVCh в пленки YBa
Publishing Information
- Journal Title
- Pis'ma v Zhurnal Tekhnicheskoj Fiziki
- Journal Volume
- 19
- Journal Issue
- 20
- Journal Page Range
- p. 7-10.
- ISSN
- 0320-0116
- CODEN
- PZTFDD
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 25054317
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BARIUM COMPOUNDS; CUPRATES; ELECTROMAGNETIC RADIATION; GHZ RANGE 01-100; HIGH-TC SUPERCONDUCTORS; MAGNETIC FIELDS; PENETRATION DEPTH; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; SURFACES; THICKNESS; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; COPPER COMPOUNDS; DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; FILMS; FREQUENCY RANGE; GHZ RANGE; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SUPERCONDUCTORS; TRANSITION ELEMENT COMPOUNDS