Published March 1996
| Version v1
Miscellaneous
Damage depth-profiling of Au+ and O+-irradiated amorphous PEEK by monoenergetic positron beams
- 1. National Inst. of Materials and Chemical Research, Tsukuba, Ibaraki (Japan)
Description
Amorphous poly(aryl-ether-ether ketone) (PEEK) irradiated with 2 MeV Au+ and O+ ions was exposed to positron beams to measure the positron annihilation Doppler broadening as a function of the positron energy. As in the previous case of O+-irradiated semicrystalline PEEK, the annihilation lines recorded at relatively low positron energies became broader with increasing irradiation dose. The thickness of the damaged layer estimated from the positron data was compared with the mean depth of the implanted ions calculated by the TRIM code. For the Au+-irradiated samples, some discrepancy was observed between the two quantities. (author)
Additional details
Publishing Information
- Imprint Title
- Proceedings of the international symposium on material chemistry in nuclear environment
- Imprint Pagination
- 935 p.
- Journal Page Range
- p. 717-723.
Conference
- Title
- international symposium on material chemistry in nuclear environment.
- Acronym
- MC'96
- Dates
- 14-15 Mar 1996.
- Place
- Tsukuba, Ibaraki (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 28040025
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- AMORPHOUS STATE; ANNIHILATION; DOPPLER BROADENING; GOLD IONS; IRRADIATION; ORGANIC POLYMERS; OXYGEN IONS; PHYSICAL RADIATION EFFECTS; POSITRON BEAMS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; INTERACTIONS; IONS; LEPTON BEAMS; LINE BROADENING; ORGANIC COMPOUNDS; PARTICLE BEAMS; PARTICLE INTERACTIONS; POLYMERS; RADIATION EFFECTS