Published October 2006 | Version v1
Journal article

Cathodoluminescence characterization of GaN quantum dots grown on 6H-SiC substrate by metal-organic chemical vapor deposition

  • 1. Nanomaterials Laboratory, National Institute for Materials Science, Nano Device Characterization Group, Namiki 1-1, Tsukuba, Ibaraki 305-0044 (Japan) and Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba 305-0005 (Japan)
  • 2. Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba 305-0005 (Japan)
  • 3. Nanomaterials Laboratory, National Institute for Materials Science, Nano Device Characterization Group, Namiki 1-1, Tsukuba, Ibaraki 305-0044 (Japan)
  • 4. Nanoelectronics Collaborative Research Center, Institute of Industrial Science, Research Center for Advanced Science and Technology, University of Tokyo Komaba, Tokyo 153-8505 (Japan)

Description

The luminescence properties of GaN quantum dots (QDs) were characterized by cathodoluminescence (CL) at room temperature via spectroscopy and monochromatic imaging. The correlations between CL results and the QD geometry measured by atomic force microscopy (AFM) were discussed considering the quantum confinement and built-in electric field in the GaN QDs. We demonstrated that CL characterizations supply abundant information about a QD system, e.g. the exciton diffusion length and the ratio of radiative recombination efficiency in the wetting layer and QDs

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2006.06.031;
PII
S1359-6462(06)00481-7;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
55
Journal Issue
8
Journal Page Range
p. 679-682
ISSN
1359-6462
CODEN
SCMAF7

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.