Effects of helical anisotropy on nonlinear voltage response in amorphous wires
- 1. Scientific-Research Institute of Natural Gases and Gas Technologies - Gazprom VNIIGAZ, Razvilka, Leninsky District, Moscow Region 142717 (Russian Federation)
- 2. Institute for Theoretical and Applied Electrodynamics, Russian Academy of Sciences, Moscow 125412 (Russian Federation)
Description
The nonlinear voltage response in soft magnetic amorphous wires exciting by an alternating current is studied. The frequency spectrum of the voltage in the pick-up coil wound around the wire with a helical anisotropy is found in the framework of a model based on quasi-static Stoner-Wohlfarth magnetization reversal. The effect of a deviation of the anisotropy axis from the azimuthal direction on the field dependences of amplitudes of voltage harmonics is analyzed. It is shown that the field sensitivity of even harmonics increases with the anisotropy axis deviation angle. The current amplitude range to obtain a maximal field sensitivity of the second harmonic is found. The influence of the skin effect on the frequency spectrum of the pick-up coil voltage is discussed. The results obtained may be of importance for the development of sensors of a weak magnetic field.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2009.05.057Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2009.05.057;
- PII
- S0304-8853(09)00586-1;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 321
- Journal Issue
- 19
- Journal Page Range
- p. 3241-3245
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41010011
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALTERNATING CURRENT; ANISOTROPY; HARMONICS; MAGNETIC FIELDS; MAGNETIZATION; SENSITIVITY; SENSORS; SKIN EFFECT; SPECTRA; WIRES
- Descriptors DEC
- CURRENTS; ELECTRIC CURRENTS; OSCILLATIONS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.