Published 2019 | Version v1
Journal article

High rate electron beam tests with MuPix8 sensors at MAMI

  • 1. Institut für Kernphysik, Mainz (Germany)

Description

The Mainz Microtron (MAMI) is an electron accelerator at the Institute for Nuclear Physics in Mainz, that provides beam energies of up to 1.6 GeV. With its narrow beam profile, quasi continuous stream of particles and beam currents of up to 100 μA it is well suited for diverse test beam applications. One of them is the high rate testing of detector prototypes. The talk discusses tests that have been conducted with MuPix8 sensor prototypes during a beam time in August 2018. Preliminary results focusing on the dependency of the detection efficiency on the particle rate will be presented. This is especially relevant for the envisaged usage of this sensor type in the P2 parity violating experiment at the new Mainz Energy-recovering Superconducting Accelerator (MESA).

Availability note (English)

Available from: https://www.dpg-verhandlungen.de/

Additional details

Publishing Information

Journal Title
Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue
Aachen 2019 issue
Journal Page Range
[1 p.]
ISSN
0420-0195
CODEN
VDPEAZ

Conference

Title
Particle physics, didactics of physics, working group jDPG, working group physics, modern information technology and artificial intelligence
Original Conference Title
DPG-Fruehjahrstagung 2019 mit den folgenden Fachverbaenden und Arbeitskreisen: Teilchenphysik, Didaktik der Physik, Arbeitskreis jDPG, Arbeitskreis Physik, moderne Informationstechnologie und Kuenstliche Intelligenz
Acronym
DPG Spring meeting 2019 of the following divisions und working groups
Dates
25-29 Mar 2019
Place
Aachen (Germany)

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
51000522
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM PROFILES; COUNTING RATES; EFFICIENCY; ELECTRON BEAMS; GEV RANGE 01-10; MICRO AMP BEAM CURRENTS; POSITION SENSITIVE DETECTORS; TESTING
Descriptors DEC
BEAM CURRENTS; BEAMS; CURRENTS; ENERGY RANGE; GEV RANGE; LEPTON BEAMS; MEASURING INSTRUMENTS; PARTICLE BEAMS; RADIATION DETECTORS

Optional Information

Notes
Session: T 45.6 Di 17:15; Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 54(3)