A new monochromator with multiple offset cylindrical lenses
Creators
Description
This article presents the optics and performance of a new monochromator (MC) with multiple offset cylindrical lenses (CLs). From ray trace simulations and a regression analysis, a single-offset CL is described in first-order matrix expressions. Based on the matrix, a new optics using multiple CLs is constituted. It is capable of energy filtering internally and forms stigmatic and non-energy dispersive images at the exit. It consists of an offset CL doublet located at a specified distance. It is also equipped with two transfer lenses and two apertures. From simulations, an energy dispersion of 23 µm/eV and an energy resolution better than 10 meV for 4 keV incident energy are achieved. Compared to previous MCs with multi-pole optics, the proposed MC has the additional advantage of a simplified structure. This MC realizes improvements in spatial resolutions for transmission electron microscopy, scanning transmission electron microscopy, and scanning electron microscopy and in energy resolutions for electron energy loss spectroscopy
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2014.10.075Additional details
Identifiers
- DOI
- 10.1016/j.nima.2014.10.075;
- PII
- S0168-9002(14)01243-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 772
- Journal Page Range
- p. 5-13
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46125508
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CYLINDRICAL CONFIGURATION; ELECTRONS; ENERGY RESOLUTION; ENERGY-LOSS SPECTROSCOPY; FILTERS; LENSES; MONOCHROMATORS; OPTICS; REGRESSION ANALYSIS; SCANNING ELECTRON MICROSCOPY; SIMULATION; SPATIAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CONFIGURATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; EVALUATION; FERMIONS; LEPTONS; MATHEMATICS; MICROSCOPY; RESOLUTION; SPECTROSCOPY; STATISTICS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.