High performance multilayered nano-crystalline silicon/silicon-oxide light-emitting diodes on glass substrates
Creators
- 1. Thin Film and Nano-Electronic Laboratory, School of ECE, University of Tehran, Tehran (Iran, Islamic Republic of)
- 2. Nano-Physics Research Laboratory, Department of Physics, University of Tehran, Tehran (Iran, Islamic Republic of)
- 3. Department of Physics, Acadia University, Wolfville, NS (Canada)
Description
A low-temperature hydrogenation-assisted sequential deposition and crystallization technique is reported for the preparation of nano-scale silicon quantum dots suitable for light-emitting applications. Radio-frequency plasma-enhanced deposition was used to realize multiple layers of nano-crystalline silicon while reactive ion etching was employed to create nano-scale features. The physical characteristics of the films prepared using different plasma conditions were investigated using scanning electron microscopy, transmission electron microscopy, room temperature photoluminescence and infrared spectroscopy. The formation of multilayered structures improved the photon-emission properties as observed by photoluminescence and a thin layer of silicon oxy-nitride was then used for electrical isolation between adjacent silicon layers. The preparation of light-emitting diodes directly on glass substrates has been demonstrated and the electroluminescence spectrum has been measured.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/22/37/375204Additional details
Identifiers
- DOI
- 10.1088/0957-4484/22/37/375204;
- PII
- S0957-4484(11)92627-0;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 22
- Journal Issue
- 37
- Journal Page Range
- [11 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43026458
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; CRYSTALLIZATION; DEPOSITION; ELECTROLUMINESCENCE; INFRARED SPECTRA; LAYERS; LIGHT EMITTING DIODES; PHOTOLUMINESCENCE; QUANTUM DOTS; RADIOWAVE RADIATION; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON OXIDES; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; FILMS; LUMINESCENCE; MICROSCOPY; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOTON EMISSION; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; SILICON COMPOUNDS; SPECTRA; SPECTROSCOPY