Characterization of electrical conductivity and temperature sensitivity of Cr/Sb-modified SnO2 ceramics
- 1. Central South University. School of Materials Science and Engineering (China)
Description
To develop new system of thermal-sensitivity materials with the feature of negative temperature coefficient (NTC) of resistivity, Sb-doped SnO2 (ATO) and Cr-modified ATO (Sn0.95−ySb0.05CryO2 (y ≤ 0.05)) ceramics are prepared. The phase component of the ceramics is analyzed by X-ray diffraction, and microstructures are observed by scanning electron microscope. The electrical conductivity and temperature sensitivity of the ceramics are investigated by analysis of the related resistance–temperature feature and complex impedance spectra (CIS). The results show that the Cr-modified ATO ceramics have excellent NTC performance, and the NTC materials constants of the ceramics can be conveniently adjusted from 1500 to 4500 K by changing the concentrations of Cr-ions. The calibration equations are adopted to fit the resistance–temperature plots of Sn0.93Sb0.05Cr0.02O2 ceramic with the Matlab program, and the results show that the Hoge-3 equation with 5 parameters has good fitting effect, indicating that it can satisfy the programing requirement for a temperature sensor well. By analyzing the CIS at different temperatures, the conduction mechanisms of the Cr-modified ATO ceramics are discussed.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 31
- Journal Issue
- 5
- Journal Page Range
- p. 4040-4049
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55074360
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CALIBRATION; CERAMICS; CHROMIUM; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; EQUATIONS; IMPEDANCE; MICROSTRUCTURE; PERFORMANCE; SCANNING ELECTRON MICROSCOPY; SENSITIVITY; SENSITIVITY ANALYSIS; SENSORS; SPECTRA; TEMPERATURE COEFFICIENT; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; MATERIALS; METALS; MICROSCOPY; PHYSICAL PROPERTIES; REACTIVITY COEFFICIENTS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2020 © Springer Science+Business Media, LLC, part of Springer Nature 2020