Published December 23, 1991
| Version v1
Journal article
Flux focusing effects in planar thin-film grain-boundary Josephson junctions
- 1. Department of Applied Physics, Stanford University, Stanford, California 94305 (United States)
- 2. Conductus Inc., 969 Maude Avenue, Sunnyvale, California 94086 (United States)
Description
We have studied the magnetic interference of the critical currents of synthetic planar thin-film grain-boundary Josephson junctions. We find that the effective area of these junctions scales as the square of the width w in contrast to the usual w(2λ+d) dependence of sandwich-type Josephson junctions. This behavior is a simple consequence of the magnetic response of thin-film superconductors to perpendicular applied fields. A model based on the London theory yields the observed behavior. In addition, we find the correction to the interference pattern due to the effect of the corners
Additional details
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 59
- Journal Issue
- 26
- Series
- Appl. Phys. Lett.
- Journal Page Range
- 3482-3484
- ISSN
- 0003-6951
- CODEN
- APPLA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23061584
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRITICAL CURRENT; GRAIN BOUNDARIES; HIGH-TC SUPERCONDUCTORS; INTERFERENCE; JOSEPHSON EFFECT; JOSEPHSON JUNCTIONS; LONDON EQUATION; MAGNETIC FIELDS; SUPERCONDUCTING FILMS
- Descriptors DEC
- CRYSTAL STRUCTURE; CURRENTS; ELECTRIC CURRENTS; EQUATIONS; FILMS; MICROSTRUCTURE; SEMICONDUCTOR JUNCTIONS; SUPERCONDUCTORS