Ferromagnetism in laser ablated ZnO and Mn-doped ZnO thin films: A comparative study from magnetization and Hall effect measurements
- 1. Laboratoire LEMA, UMR 6157 CNRS - Universite F. Rabelais, Parc de Grandmont, 37200 Tours (France)
- 2. Laboratoire GeMAC, UMR 8635 CNRS - Universite de Versailles, Place A. Briand, 92195 Meudon (France)
Description
Room temperature FM was observed in pristine ZnO thin films grown by pulsed laser deposition on Al2O3 substrates. It seems to originate from other defects but not oxygen vacancies. Magnetization of thinner films is much larger than that of the thicker films, indicating that defects are mostly located at the surface and/or the interface between the film and the substrate. Data on the Fe:ZnO and Mn:ZnO films show that a transition-metal doping does not play any essential role in introducing the magnetism into ZnO. In the case of Mn doping, the magnetic moment could be very slightly enhanced. Hall effect measurements reveal that an incorporation of Mn does not change the carrier type, but decreases the carrier concentration, and increases the Hall mobility, resulting in more resistive Mn:ZnO films. Since no anomalous Hall effect was observed, it is understood that the observed FM is not due to the interaction between the free-carrier and the Mn impurity.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2009.07.142Additional details
Identifiers
- DOI
- 10.1016/j.physb.2009.07.142;
- PII
- S0921-4526(09)00654-1;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 404
- Journal Issue
- 21
- Journal Page Range
- p. 3978-3981
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41086061
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM OXIDES; CRYSTAL DEFECTS; DOPED MATERIALS; ENERGY BEAM DEPOSITION; FERROMAGNETISM; HALL EFFECT; IMPURITIES; INTERACTIONS; INTERFACES; LASER RADIATION; MAGNETIC MOMENTS; MAGNETIZATION; MANGANESE ADDITIONS; MOBILITY; PULSED IRRADIATION; SEMICONDUCTOR MATERIALS; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TRANSITION ELEMENTS; VACANCIES; ZINC OXIDES
- Descriptors DEC
- ALLOYS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEPOSITION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IRRADIATION; MAGNETISM; MANGANESE ALLOYS; MATERIALS; METALS; OXIDES; OXYGEN COMPOUNDS; POINT DEFECTS; RADIATIONS; SURFACE COATING; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.