On the use of OSL of wire-bond chip card modules for retrospective and accident dosimetry
Creators
- 1. Helmholtz Zentrum Muenchen - German Research Centre for Environmental Health, Institute of Radiation Protection, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany)
- 2. Infineon Technologies AG, Wernerwerkstrasse 1, D-93049 Regensburg (Germany)
Description
The potential of optically stimulated luminescence of wire-bond chip card modules, used in health insurance, ID, cash and credit cards for retrospective and accident dosimetry is investigated. Chip card modules obtained directly from the producer, using a widely spread UV-cured epoxy product for encapsulation, are used as basis for the study. The radiation sensitivity is due to silica grains added to the epoxy for controlling the thixotropic properties. Luminescence properties are complex due to the presumed thermo-optical release of electrons from the epoxy and transfer into the silica. Best results and highest sensitivity are obtained by using no or only low preheat treatments. A high degree of fading of the OSL signal during storage at room temperature is observed, which is tentatively explained by the superposition of thermal decay of shallow OSL traps and athermal (anomalous) decay of deeper OSL traps. The dose response of the OSL signal shows exponentially saturating behaviour, with saturation doses of 77 Gy or 9.6 Gy, depending on pretreatment. Dose recovery tests show that given doses can be recovered within a deviation of ±14%, if measured signals are corrected for fading. The minimum detectable dose is estimated at ∼3 mGy, ∼10 mGy and ∼20 mGy for readouts immediately, 1 day and 10 days after exposure, respectively.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.radmeas.2009.02.016Additional details
Identifiers
- DOI
- 10.1016/j.radmeas.2009.02.016;
- PII
- S1350-4487(09)00042-0;
Publishing Information
- Journal Title
- Radiation Measurements
- Journal Volume
- 44
- Journal Issue
- 5-6
- Journal Page Range
- p. 548-553
- ISSN
- 1350-4487
- CODEN
- RMEAEP
Conference
- Title
- 12. international conference on luminescence and electron spin resonance dating
- Acronym
- LED 2008
- Dates
- 18-22 Sep 2008
- Place
- Beijing (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41026769
- Subject category
- S61: RADIATION PROTECTION AND DOSIMETRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DOSE-RESPONSE RELATIONSHIPS; DOSIMETRY; LUMINESCENCE; RADIATION DOSES; SENSITIVITY
- Descriptors DEC
- DOSES; EMISSION; PHOTON EMISSION
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.