Published May 2009 | Version v1
Journal article

On the use of OSL of wire-bond chip card modules for retrospective and accident dosimetry

  • 1. Helmholtz Zentrum Muenchen - German Research Centre for Environmental Health, Institute of Radiation Protection, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany)
  • 2. Infineon Technologies AG, Wernerwerkstrasse 1, D-93049 Regensburg (Germany)

Description

The potential of optically stimulated luminescence of wire-bond chip card modules, used in health insurance, ID, cash and credit cards for retrospective and accident dosimetry is investigated. Chip card modules obtained directly from the producer, using a widely spread UV-cured epoxy product for encapsulation, are used as basis for the study. The radiation sensitivity is due to silica grains added to the epoxy for controlling the thixotropic properties. Luminescence properties are complex due to the presumed thermo-optical release of electrons from the epoxy and transfer into the silica. Best results and highest sensitivity are obtained by using no or only low preheat treatments. A high degree of fading of the OSL signal during storage at room temperature is observed, which is tentatively explained by the superposition of thermal decay of shallow OSL traps and athermal (anomalous) decay of deeper OSL traps. The dose response of the OSL signal shows exponentially saturating behaviour, with saturation doses of 77 Gy or 9.6 Gy, depending on pretreatment. Dose recovery tests show that given doses can be recovered within a deviation of ±14%, if measured signals are corrected for fading. The minimum detectable dose is estimated at ∼3 mGy, ∼10 mGy and ∼20 mGy for readouts immediately, 1 day and 10 days after exposure, respectively.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radmeas.2009.02.016

Additional details

Identifiers

DOI
10.1016/j.radmeas.2009.02.016;
PII
S1350-4487(09)00042-0;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
44
Journal Issue
5-6
Journal Page Range
p. 548-553
ISSN
1350-4487
CODEN
RMEAEP

Conference

Title
12. international conference on luminescence and electron spin resonance dating
Acronym
LED 2008
Dates
18-22 Sep 2008
Place
Beijing (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41026769
Subject category
S61: RADIATION PROTECTION AND DOSIMETRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DOSE-RESPONSE RELATIONSHIPS; DOSIMETRY; LUMINESCENCE; RADIATION DOSES; SENSITIVITY
Descriptors DEC
DOSES; EMISSION; PHOTON EMISSION

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.