Published July 2010 | Version v1
Journal article

Orientation dependence of electron energy loss spectra and dielectric functions of Ti3SiC2 and Ti3AlC2

  • 1. LEM, ONERA-CNRS, BP 72, F-92322 Chatillon (France)
  • 2. Thin Film Physics Division, IFM, Linkoeping University, SE-581 83 Linkoeping (Sweden)
  • 3. Carl Zeiss NTS GmbH, D-73447 Oberkochen (Germany)

Description

We employ monochromatized electron energy loss spectroscopy to study Ti3SiC2 and Ti3AlC2. By probing individual grains aligned along different axes in bulk polycrystalline Ti3SiC2 and Ti3AlC2, this approach enables determination of the anisotropy of the dielectric functions and an estimate of the free-electron lifetime in different orientations. The dielectric functions are characterized by strong interband transitions in the low energy region. The energies plasmon resonance were determined to be ∼5eV and exhibit a strong orientation-dependence. Our measurements show that the free-electron lifetimes are also highly orientation-dependent. These results suggest that scattering of carriers in MAX phases is very sensitive to composition and orientation.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2010.05.007

Additional details

Identifiers

DOI
10.1016/j.ultramic.2010.05.007;
PII
S0304-3991(10)00154-3;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
110
Journal Issue
8
Journal Page Range
p. 1054-1058
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
International workshop on enhanced data generated by electrons
Dates
18-22 May 2009
Place
Banff (Canada)

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.